Measurement of Transnational Patent Quality in the High-Tech Fields

Zheng Hang,Ye Azhong

Science & Technology Progress and Policy ›› 2024, Vol. 41 ›› Issue (11) : 89-98.

PDF(1205 KB)
PDF(1205 KB)
Science & Technology Progress and Policy ›› 2024, Vol. 41 ›› Issue (11) : 89-98. DOI: 10.6049/kjjbydc.2023010023
Evaluation and Foresight

Measurement of Transnational Patent Quality in the High-Tech Fields

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 41(11): 89-98 https://doi.org/10.6049/kjjbydc.2023010023

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(1205 KB)

Accesses

Citation

Detail
Sections
Recommended
  • 公众号
  • 订阅号
  • 企业微信客服
    • Copyright © Science & Technology Progress and Policy, All Rights Reserved.
    Tel: (027)87277066 87713900 87277556　
    Fax: (027)87277066　
    E-mail：bianwu@kjjb.org
    Powered by Beijing Magtech Co. Ltd.

    /

    〈 〉